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Effective screening of integrated circuits.Automated DC pin to pin test method for effective evaluation and screening of integrated circuits
Document ID
19680046267
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Thomas, E. F., Jr.
Date Acquired
August 4, 2013
Publication Date
January 1, 1968
Publication Information
Publisher: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC.,
Subject Category
Electronic Equipment
Meeting Information
Meeting: ANNUAL RELIABILITY PHYSICS SYMPOSIUM
Location: LOS ANGELES, CA
Start Date: November 6, 1967
End Date: November 8, 1967
Sponsors: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS
Accession Number
68A27239
Distribution Limits
Public
Copyright
Other

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