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Field-electron-microscopy studies of cesium layers on various refractory metals - Work function change.
Work function variation with Cs layer coverage on W, Mo, Re and Ni substrates, using field electron microscopes
Document ID
19680049674
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Strayer, R. W.
Swanson, L. W.
Date Acquired
August 4, 2013
Publication Date
March 15, 1968
Subject Category
Physics, Solid-State
Accession Number
68A30646
Distribution Limits
Public
Copyright
Other
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