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Fault testing and diagnosis in combinational digital circuits.Test schedule design for nontransient fault detection, location and diagnosis in combinational digital circuits /switching networks/
Document ID
19680052292
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kautz, W. H.
Date Acquired
August 4, 2013
Publication Date
April 1, 1968
Subject Category
Electronics
Meeting Information
Meeting: COMPUTER CONFERENCE
Location: CHICAGO, IL
Start Date: September 6, 1967
End Date: September 8, 1967
Sponsors: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS
Accession Number
68A33264
Funding Number(s)
CONTRACT_GRANT: NAS12-33
Distribution Limits
Public
Copyright
Other

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