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A method for determining and testing for second breakdown characteristics in transistors.Test equipment for second breakdown characteristics of power transistors
Document ID
19680056012
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Morris, J. K.
Date Acquired
August 4, 2013
Publication Date
January 1, 1967
Publication Information
Publisher: WESTERN PERIODICALS CO.,
Subject Category
Electronic Equipment
Meeting Information
Meeting: SYMPOSIUM ON NONDESTRUCTIVE EVALUATION OF AEROSPACE AND WEAPONS SYSTEMS COMPONENTS AND MATERIALS
Location: SAN ANTONIO, TX
Start Date: April 17, 1967
End Date: April 19, 1967
Accession Number
68A36984
Distribution Limits
Public
Copyright
Other

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