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Eliminate power transistor second breakdown failures.Power transistor second breakdown failures, discussing reliability improvement
Document ID
19680056643
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Morris, J. K.
Date Acquired
August 4, 2013
Publication Date
January 1, 1968
Publication Information
Publisher: AMERICAN SOCIETY OF MECHANICAL ENGINEERS,
Subject Category
Electronic Equipment
Meeting Information
Meeting: RELIABILITY AND MAINTAINABILITY CONFERENCE
Location: SAN FRANCISCO, CA
Start Date: July 14, 1968
End Date: July 17, 1968
Accession Number
68A37615
Distribution Limits
Public
Copyright
Other

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