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Electron microbeam testing of integrated circuits
Document ID
19680072605
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Crawford, C. K. (Massachusetts Inst. of Tech. Cambridge, MA, United States)
Date Acquired
August 4, 2013
Publication Date
February 1, 1968
Subject Category
Unknown
Report/Patent Number
NASA-CR-96171
TR-2
Report Number: NASA-CR-96171
Report Number: TR-2
Accession Number
68N87416
Funding Number(s)
CONTRACT_GRANT: NAS12-558
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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