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Spherical ion sourceRadial focusing of electrons in ion source produces greater ion densities, resulting in higher resolution and focus capability for a given source volume. Electron beam is focused near exit aperture by spherical fields. High density ions allow focusing ion beam to high density at echo, allowing high current through small aperture.
Document ID
19690000186
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Hall, L. G.
Date Acquired
August 5, 2013
Publication Date
June 1, 1969
Subject Category
Electronic Components And Circuits
Report/Patent Number
XNP-08898
Report Number: XNP-08898
Accession Number
69B10186
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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