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Multiple-mask chemical etchingMultiple masking techniques use lateral etching to reduce the total area of the high etch-rate oxide exposed to the chemical etchant. One method uses a short-term etch to remove the top layer from the silicon oxide surface, another acts before the top layer is grown.
Document ID
19690000221
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Cannon, D. L.
Date Acquired
August 5, 2013
Publication Date
August 1, 1969
Subject Category
Electronic Components And Circuits
Report/Patent Number
MSC-13114
Report Number: MSC-13114
Accession Number
69B10221
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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