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Surface profilometer for examining grain-boundary groovesSurface profilometer, consisting primarily of commercially available components, measures surface topographical features accurately and precisely. It shows improvement over the interferometric technique in measurement of grain-boundary grooves formed during annealing on nickel-oxide bicrystals.
Document ID
19690000344
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Jech, R. E.
Ready, D. W.
Date Acquired
August 5, 2013
Publication Date
August 1, 1969
Subject Category
Mechanics
Report/Patent Number
ARG-10290
Report Number: ARG-10290
Accession Number
69B10345
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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