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An electronic circuit for sensing malfunctions in test instrumentationMonitoring device differentiates between malfunctions occurring in the system undergoing test and malfunctions within the test instrumentation itself. Electronic circuits in the monitor use transistors to commutate silicon controlled rectifiers by removing the drive voltage, display circuits are then used to monitor multiple discrete lines.
Document ID
19690000386
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Miller, W. M., Jr.
Date Acquired
August 5, 2013
Publication Date
December 1, 1969
Subject Category
Electronic Components And Circuits
Report/Patent Number
KSC-10209
Report Number: KSC-10209
Accession Number
69B10392
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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