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Deposition monitor and controlTwo quartz crystal oscillators monitor and control the thickness and the rate of thin film deposition. The outputs of both oscillators, one exposed to mass and heat and the other exposed only to heat, were mixed and the difference frequency was used as the indication of film thickness.
Document ID
19690000631
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Salisbury, S. S.
Date Acquired
August 5, 2013
Publication Date
December 1, 1969
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-10706
Report Number: NPO-10706
Accession Number
69B10722
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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