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The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 2 - General studies, mainly non-thermalScanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Nonthermal effects in Read diodes
Document ID
19690006587
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Sulway, D. V. (University Coll. of North Wales Bangor, United Kingdom)
Thornton, P. R. (University Coll. of North Wales Bangor, United Kingdom)
Wayte, R. C. (University Coll. of North Wales Bangor, United Kingdom)
Date Acquired
August 5, 2013
Publication Date
January 1, 1968
Subject Category
Physics, General
Report/Patent Number
NASA-CR-99041
Report Number: NASA-CR-99041
Accession Number
69N15919
Funding Number(s)
CONTRACT_GRANT: NGR-52-117-001
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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