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The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 3 - Thermal runaway in multi-emitter power transistorsScanning electron microscopy applications in study of thermal runaway in multi-emitter power transistors
Document ID
19690006588
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Sulway, D. V. (University Coll. of North Wales Bangor, United Kingdom)
Thornton, P. R. (University Coll. of North Wales Bangor, United Kingdom)
Date Acquired
August 5, 2013
Publication Date
January 1, 1968
Subject Category
Physics, General
Report/Patent Number
NASA-CR-99057
Report Number: NASA-CR-99057
Accession Number
69N15920
Funding Number(s)
CONTRACT_GRANT: NGR-52-117-001
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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