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Process techniques study of integrated circuits Quarterly report no. 11Dielectric defects in oxide layers by ion migration, and hydrogen effects on integrated circuits with packaging considerations
Document ID
19690026877
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Meinhard, J. E. (Autonetics Anaheim, CA, United States)
Date Acquired
August 5, 2013
Publication Date
February 15, 1969
Subject Category
Electronic Equipment
Report/Patent Number
QR-11
NASA-CR-86224
Report Number: QR-11
Report Number: NASA-CR-86224
Accession Number
69N36255
Funding Number(s)
CONTRACT_GRANT: NAS12-4
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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