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Some parameters affecting Auger and photoelectron spectroscopy as an analytical technique.Auger and photoelectron spectroscopy for chemical analysis, noting effects of sample thickness, sample potential, surface contamination and X ray incident angle
Document ID
19690041786
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Adler, I.
Lamothe, R.
Yin, L. I.
Date Acquired
August 5, 2013
Publication Date
February 1, 1969
Subject Category
Chemistry
Accession Number
69A19775
Distribution Limits
Public
Copyright
Other

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