NTRS
NTRS - NASA Technical Reports Server
Search
more_vert
Collections
About
News
Help
Login
Press Enter or click the Search button to begin your search.
Back to Results
Reliability assessment of microcircuits and microelectronic systems.
Microcircuit components and microelectronic systems reliability assessment including short term testing, noting digital systems, packaging, production controls, etc
Document ID
19690042995
Acquisition Source
Legacy CDMS
Document Type
Book Chapter
Authors
Hall, E. C.
Date Acquired
August 5, 2013
Publication Date
January 1, 1968
Publication Information
Publisher:
TECHNIVISION SERVICES,
Subject Category
Electronic Equipment
Report/Patent Number
AGARDOGRAPH-114
Report Number: AGARDOGRAPH-114
Accession Number
69A20984
Funding Number(s)
CONTRACT_GRANT: NAS9-4065
Distribution Limits
Public
Copyright
Other
Available Downloads
There are no available downloads for this record.
Related Records
There are no records associated with this record.
visibility_off
No Preview Available