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Some observations on charge buildup and release in silicon dioxide irradiated with low energy electrons.Positive space charge buildup produced in silicon dioxide by low energy electrons as function of beam energy and oxide thickness
Document ID
19690045183
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Hauser, J. R.
Monteith, L. K.
Simons, M., Jr.
Date Acquired
August 5, 2013
Publication Date
January 1, 1969
Subject Category
Physics, Solid-State
Accession Number
69A23172
Distribution Limits
Public
Copyright
Other

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