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The analysis of accelerated temperature-tests.Accelerated temperature tests, calculating temperature behavior of hazard rates and activation energy from failure data using computer simulation
Document ID
19690056520
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Evans, R. A.
Date Acquired
August 5, 2013
Publication Date
January 1, 1969
Publication Information
Publisher: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC.
Subject Category
Facilities, Research, And Support
Meeting Information
Meeting: ANNUAL SYMPOSIUM ON RELIABILITY
Location: CHICAGO, ILL.
Start Date: January 21, 1969
End Date: January 23, 1969
Accession Number
69A34509
Distribution Limits
Public
Copyright
Other

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