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Programmed test patterns for multiterminal devices.Computer program for generation of test patterns for multiterminal devices and networks
Document ID
19690061615
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Happ, W. W.
Mcintosh, F. J.
Date Acquired
August 5, 2013
Publication Date
January 1, 1969
Publication Information
Publisher: AFIPS PRESS,
Subject Category
Computers
Meeting Information
Meeting: AMERICAN FEDERATION OF INFORMATION PROCESSING SOCIETIES, SPRING JOINT COMPUTER CONFERENCE
Location: BOSTON, MASS.
Start Date: May 14, 1969
End Date: May 16, 1969
Sponsors: AMERICAN FEDERATION OF INFORMATION PROCESSING SOCIETIES
Accession Number
69A39604
Distribution Limits
Public
Copyright
Other

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