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Algorithms for test patterns in multiterminal devices with symmetry constraints.N-terminal parent networks with symmetry constraints derived for nonredundant one port configurations through combinatorial functions test patterns, using computer algorithm
Document ID
19690064535
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Happ, W. W.
Weitzenfeld, A. S.
Date Acquired
August 5, 2013
Publication Date
January 1, 1969
Publication Information
Publisher: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC.
Subject Category
Computers
Meeting Information
Meeting: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS, INTERNATIONAL CONFERENCE ON COMMUNICATIONS
Location: BOULDER, COLO.
Start Date: June 9, 1969
End Date: June 11, 1969
Sponsors: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS
Accession Number
69A42524
Distribution Limits
Public
Copyright
Other

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