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A power semiconductor test circuit with reduced power requirementsSwitching circuit utilizing silicon controlled rectifier reduces input power requirements normally associated with testing power semiconductors in an operational type mode. Circuit alleviates problems of inaccessibility, lack of large amounts of power, physical size of power resistors, wiring, and heat generation.
Document ID
19700000480
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Been, J. F.
Date Acquired
August 5, 2013
Publication Date
December 1, 1970
Subject Category
Electronic Components And Circuits
Report/Patent Number
LEW-11175
Report Number: LEW-11175
Accession Number
70B10498
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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