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An improved method for thin-film thickness measurementsInterference pattern fringe for measuring thin films on metal
Document ID
19700010501
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Forsten, R. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Zurasky, J. L. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 2, 2013
Publication Date
January 5, 1970
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-X-53979
Report Number: NASA-TM-X-53979
Accession Number
70N19806
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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