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Computerized microstrain test systemDesign of computerized microstrain test apparatus to measure plastic deformation, hysteresis, and total strain energy at microinch sensitivities
Document ID
19700015498
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Curran, T. P. (NASA Electronics Research Center Cambridge, MA, United States)
Krawiec, J. P. (NASA Electronics Research Center Cambridge, MA, United States)
Lyons, J. W. (NASA Electronics Research Center Cambridge, MA, United States)
Pambookian, H. C. (NASA Electronics Research Center Cambridge, MA, United States)
Date Acquired
September 2, 2013
Publication Date
April 1, 1970
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-X-1990
C-110
Report Number: NASA-TM-X-1990
Report Number: C-110
Accession Number
70N24803
Funding Number(s)
CONTRACT_GRANT: 129-03-42-04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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