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The application of scanning electron microscopy to bulk devices. Part 1 - Gunn diodesFeasibility study of scanning electron microscopy to diagnose properties of small Gunn diodes
Document ID
19700021118
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Gopinath, A. (University Coll. of North Wales Bangor, United Kingdom)
Shaw, D. A. (University Coll. of North Wales Bangor, United Kingdom)
Sulway, D. V. (University Coll. of North Wales Bangor, United Kingdom)
Thornton, P. R. (University Coll. of North Wales Bangor, United Kingdom)
Date Acquired
August 5, 2013
Publication Date
November 1, 1968
Subject Category
Electronic Equipment
Report/Patent Number
NASA-CR-110407
Report Number: NASA-CR-110407
Accession Number
70N30429
Funding Number(s)
CONTRACT_GRANT: NGR-52-117-001
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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