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An algorithm and a program for generation of test patterns for sequential circuitsTest pattern generation algorithm and program for failure detection in asynchronous sequential logic circuits, using combinational method
Document ID
19700050089
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Putzolu, G. R.
Roth, J. P.
Date Acquired
August 5, 2013
Publication Date
January 1, 1970
Publication Information
Publisher: WESTERN PERIODICALS CO.,
Subject Category
Electronics
Meeting Information
Meeting: U. OF HAWAII, HAWAII INTERNATIONAL CONFERENCE ON SYSTEM SCIENCES, 3RD, U. OF HAWAII
Location: HONOLULU, HI
Start Date: January 14, 1970
End Date: January 16, 1970
Sponsors: U. OF HAWAII
Accession Number
70A26205
Distribution Limits
Public
Copyright
Other

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