NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
A novel nondestructive, noncontacting method of measuring the depth of thin slits and cracks in metalsNondestructive noncontacting microwave depth measurement of thin slits and cracks in metal surfaces
Document ID
19700054391
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Feinstein, L.
Hruby, R. J.
Date Acquired
August 5, 2013
Publication Date
May 1, 1970
Subject Category
Instrumentation And Photography
Accession Number
70A30507
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available