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Orientation dependence of the gage factor in electron-irradiated siliconCrystal orientation dependence of thermal resistance and gage factor in electron irradiated n-type silicon strain gages
Document ID
19700064746
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Gross, C.
Littlejohn, M. A.
Date Acquired
August 5, 2013
Publication Date
January 1, 1970
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: INSTRUMENT SOCIETY OF AMERICA, ANNUAL SYMPOSIUM ON TEST MEASUREMENT, 6TH
Location: HOUSTON, TX
Start Date: October 27, 1969
End Date: October 30, 1969
Sponsors: /INSTRUMENT SOCIETY OF AMERICA
Accession Number
70A40862
Distribution Limits
Public
Copyright
Other

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