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On the extraction of pattern features from continuous measurementsSuboptimum extraction of pattern features from continuous measurements, assuming different Gaussian random classes
Document ID
19700067377
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Caprihan, A.
De Figueiredo, R. J. P.
Date Acquired
August 5, 2013
Publication Date
April 1, 1970
Subject Category
Communications
Meeting Information
Meeting: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS, SYMPOSIUM ON ADAPTIVE PROCESSES
Location: UNIVERSITY PARK, PA
Start Date: November 17, 1969
End Date: November 19, 1969
Sponsors: /INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS
Accession Number
70A43493
Funding Number(s)
CONTRACT_GRANT: NGL-44-006-033
Distribution Limits
Public
Copyright
Other

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