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Variable sweep-rate shortens dynamic testing timeMethod adjusts sweep frequency of tested system such that sweep is nominal when selected dynamic event occurs, but is rapid otherwise. Technique achieves time reductions of 7.5 to 1, maintains 0.5 percent accuracy in the results, and has several industrial applications.
Document ID
19710000250
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Lorenzo, C. F.
Date Acquired
August 6, 2013
Publication Date
July 1, 1971
Subject Category
Electronic Systems
Report/Patent Number
LEW-11238
Report Number: LEW-11238
Accession Number
71B10251
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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