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Improved charged-particle analyzer - A conceptDevice utilizes concept that charged-particle analysis is achievable by applying sinusoidal voltage across two conductive deflection plates with predetermined curvature and constant spacing to define selective passageway for charged particles to be analyzed. Four advantages of improved device are cited.
Document ID
19710000282
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Dimeff, J.
Date Acquired
August 6, 2013
Publication Date
August 1, 1971
Subject Category
Physical Sciences
Report/Patent Number
XAC-05506
Report Number: XAC-05506
Accession Number
71B10283
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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