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Contact-resistance test probes: A conceptDevices are used in inspection of contact resistance in plated connectors after assembly into cables. System permits rapid inspection of connectors when mating connectors or special apparatus are not available, and enables source of excessive resistance to be precisely determined.
Document ID
19710000468
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Brooks, C. H. (N. AM. ROCKWELL CORP.)
Maxwell, J. H.
Mc Dermott, R. J.
Date Acquired
August 6, 2013
Publication Date
December 1, 1971
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-16891
Report Number: MFS-16891
Accession Number
71B10471
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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