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Electron optical metallographic instrumentsElectron optical metallographic instruments including electron microprobe X ray analyzer, scanning electron microscope, and transmission electron microscope
Document ID
19710005323
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Andrews, C. W. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 2, 2013
Publication Date
January 1, 1970
Subject Category
Instrumentation And Photography
Report/Patent Number
E-6106
NASA-TM-X-52949
Report Number: E-6106
Report Number: NASA-TM-X-52949
Accession Number
71N14798
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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