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Micrometeoroid penetration measuring device PatentMeasuring micrometeroid depth of penetration into various materials
Document ID
19710013764
Acquisition Source
Legacy CDMS
Document Type
Other - Other
Authors
Kinard, W. H. (NASA Langley Research Center Hampton, VA, United States)
Laney, C. C., Jr. (NASA Langley Research Center Hampton, VA, United States)
Siviter, J. H., Jr. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 6, 2013
Publication Date
October 22, 1968
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-CASE-XLA-00941
Patent Application Number: US-PATENT-APPL-SN-508873
Patent Number: US-PATENT-3,407,304
Accession Number
71N23240
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-XLA-00941|US-PATENT-3,407,304
Patent Application
US-PATENT-APPL-SN-508873

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