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Strain gauge measuring techniques PatentStrain gage measurement of elongation due to thermally and mechanically induced stresses
Document ID
19710014757
Acquisition Source
Legacy CDMS
Document Type
Other - Other
Authors
Cepollina, F. J. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 6, 2013
Publication Date
August 12, 1969
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-CASE-XGS-04478
Patent Number: US-PATENT-3,460,378
Patent Application Number: US-PATENT-APPL-SN-566717
Accession Number
71N24233
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-XGS-04478|US-PATENT-3,460,378
Patent Application
US-PATENT-APPL-SN-566717

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