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Method of temperature compensating semiconductor strain gages PatentMethod for temperature compensating semiconductor gages by exposure to high energy radiation
Document ID
19710016416
Acquisition Source
Legacy CDMS
Document Type
Other - Other
Authors
Gross, C. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 6, 2013
Publication Date
September 23, 1969
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-CASE-XLA-04555-1
Patent Number: US-PATENT-3,468,727
Patent Application Number: US-PATENT-APPL-SN-594584
Accession Number
71N25892
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-XLA-04555-1|US-PATENT-3,468,727
Patent Application
US-PATENT-APPL-SN-594584

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