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Methods of measurement for semiconductor materials, process control, and devicesTuning and photovoltaic methods and identification of test conditions for measurement of semiconductor materials, process control, and devices
Document ID
19710029028
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Bullis, W. M. (National Bureau of Standards Washington, DC, United States)
Date Acquired
August 6, 2013
Publication Date
October 1, 1971
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-CR-123167
NBS-TN-598
Report Number: NASA-CR-123167
Report Number: NBS-TN-598
Accession Number
71N38504
Funding Number(s)
CONTRACT_GRANT: NASA ORDER S-70003G
CONTRACT_GRANT: NAVY ORDER PO-1-0030
CONTRACT_GRANT: NAVY ORDER PO-1-0041
CONTRACT_GRANT: NASA ORDER H-76553A
CONTRACT_GRANT: DASA ORDER EA071
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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