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Radiation-induced electron trapping in M.I.S. transistorsElectron trapping in MIS transistor, discussing thermal annealing process activation energy and trap production by radiation
Document ID
19710038802
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Brashears, S. S.
Danchenko, V.
Walker, J. D., Jr.
Date Acquired
August 6, 2013
Publication Date
June 1, 1969
Subject Category
Electronic Equipment
Meeting Information
Meeting: COLLOQUE INTERNATIONAL SUR LES PROPRIETES ET UTILISATION DES STRUCTURES MIS
Location: GRENOBLE
Country: FRANCE
Start Date: June 17, 1969
End Date: June 20, 1969
Sponsors: CENTRE D'ETUDES NUCLEAIRES
Accession Number
71A19499
Distribution Limits
Public
Copyright
Other

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