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Electron radiation damage effects in silicon surface-barrier detectorsElectron radiation bulk damage effects on Si surface barrier detectors, determining reverse leakage current density and alpha particle response changes
Document ID
19710041145
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Coleman, J. A.
Liu, Y. M.
Date Acquired
August 6, 2013
Publication Date
February 1, 1971
Subject Category
Physics, Solid-State
Meeting Information
Meeting: NUCLEAR SCIENCE SYMPOSIUM
Location: NEW YORK, NY
Start Date: November 4, 1970
End Date: November 6, 1970
Sponsors: INST. OF ELECTRICAL AND ELECTRONICS ENGINEERS
Accession Number
71A21842
Distribution Limits
Public
Copyright
Other

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