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A refined step-recovery technique for measuring minority carrier lifetimes and related parameters in asymmetric p-n junction diodesForward biased asymmetric p-n junction diodes with arbitrary impurity distributions, measuring minority carrier lifetimes by refined step recovery technique
Document ID
19710041551
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Dean, R. H.
Nuese, C. J.
Date Acquired
August 6, 2013
Publication Date
March 1, 1971
Subject Category
Electronic Equipment
Accession Number
71A22248
Funding Number(s)
CONTRACT_GRANT: NAS12-2091
Distribution Limits
Public
Copyright
Other

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