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New strain analysis technique based on thin- film optical measurementsStrain analysis based on thin metallic film optical measurements, determining principal strain directions from wrinkle and microfracture patterns
Document ID
19710053854
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Williams, J. G.
Date Acquired
August 6, 2013
Publication Date
May 1, 1971
Publication Information
Publisher: SOCIETY FOR EXPERIMENTAL STRESS ANALYSIS,
Subject Category
Structural Mechanics
Report/Patent Number
SESA PAPER 1828A
Report Number: SESA PAPER 1828A
Meeting Information
Meeting: SPRING MEETING ON NEW STRAIN ANALYSIS TECHNIQUE BASED ON THIN-FILM OPTICAL MEASUREMENTS
Location: SALT LAKE CITY, UT
Start Date: May 18, 1971
End Date: May 21, 1971
Sponsors: SOCIETY FOR EXPERIMENTAL STRESS ANALYSIS
Accession Number
71A34551
Distribution Limits
Public
Copyright
Other

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