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Study of in-situ degradation of thermal control surfacesExperimental technique used in study of damage mechanism to semiconductor pigments exposed to ultraviolet radiation can be adapted for investigations of surface chemistry and may be used analytically to determine contamination.
Document ID
19720000335
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Gilligan, J. E.
(IIT Res. Inst.)
Zerlaut, G. A.
(IIT Res. Inst.)
Date Acquired
August 6, 2013
Publication Date
July 1, 1972
Subject Category
Materials
Report/Patent Number
MFS-20892
Report Number: MFS-20892
Accession Number
72B10336
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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