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Alignment microscope for rotating laser scannerMicroscopic assembly for alignment of rotary laser focuses on small film area along scan line at oblique angle. Suitable choice of angle and location of optical components project laser beam line as X coordinate reticle. Coordination with horizontal recticle line included microscope facilitates Y coordinate position indexing.
Document ID
19720000434
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Maciel, A., Jr.
(Singer-Gen. Precision, Inc.)
Beck, J. C.
(Singer-Gen. Precision, Inc.)
Date Acquired
August 6, 2013
Publication Date
December 1, 1972
Subject Category
Physical Sciences
Report/Patent Number
MSC-14118
Report Number: MSC-14118
Accession Number
72B10435
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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