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Magnetic circuitry mutual coupling probeDevelopment of magnetic probe for nondestructive testing of multilayer printed circuit boards to determine existence of opens or shorts is reported. Components of probe are described and procedures for operation are discussed. Two illustrations are provided to show magnetic circuits and principles of operation.
Document ID
19720000534
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Anthony, P. L. (N. Am. Rockwell Corp.)
Date Acquired
August 6, 2013
Publication Date
September 1, 1972
Subject Category
Electronic Systems
Report/Patent Number
MFS-21664
Report Number: MFS-21664
Accession Number
72B10535
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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