NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Radiation tolerance of aluminum-doped siliconData are presented that indicate that heat-treated Czochralski-grown aluminum doped silicon that undergoes an appreciable resistivity increase during heating at approximately 450 C is significantly more resistant to both neutron and gamma irradiation than boron doped material (or aluminum doped material that either has not been heat treated or does not experience an appreciable resistivity change during such a treatment). Data interpretation is, however, quite difficult due to the occurrence of severe trapping effects in heat treated material.
Document ID
19720002411
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Curtis, O. L., Jr.
(Northrop Corporate Labs. Hawthorne, CA, United States)
Srour, J. R.
(Northrop Corporate Labs. Hawthorne, CA, United States)
Date Acquired
August 6, 2013
Publication Date
September 15, 1971
Publication Information
Publication: JPL Proc. of the Fourth Ann. Conf. on Effects of Lithium Doping on Silicon Solar Cells
Subject Category
Auxiliary Systems
Accession Number
72N10060
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available