A method of treating the non-grey error in total emittance measurements

In techniques for the rapid determination of total emittance, the sample is generally exposed to surroundings that are at a different temperature than the sample's surface. When the infrared spectral reflectance of the surface is spectrally selective, these techniques introduce an error into the total emittance values. Surfaces of aluminum overcoated with oxides of various thicknesses fall into this class. Because they are often used as temperature control coatings on satellites, their emittances must be accurately known. The magnitude of the error was calculated for Alzak and silicon oxide-coated aluminum and was shown to be dependent on the thickness of the oxide coating. The results demonstrate that, because the magnitude of the error is thickness-dependent, it is generally impossible or impractical to eliminate it by calibrating the measuring device.