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Design and analysis of an automatic method of measuring silicon-controlled-rectifier holding currentThe design of an automated SCR holding-current measurement system is described. The circuits used in the measurement system were designed to meet the major requirements of automatic data acquisition, reliability, and repeatability. Performance data are presented and compared with calibration data. The data verified the accuracy of the measurement system. Data taken over a 48-hr period showed that the measurement system operated satisfactorily and met all the design requirements.
Document ID
19720005558
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Maslowski, E. A.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 2, 2013
Publication Date
December 1, 1971
Subject Category
Electronic Equipment
Report/Patent Number
E-6578
NASA-TM-X-2463
Report Number: E-6578
Report Number: NASA-TM-X-2463
Accession Number
72N13207
Funding Number(s)
PROJECT: RTOP 112-27
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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