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Lunar rilles: A catalog and method of classificationA representative sample of lunar rilles observed on Lunar Orbiter 4 and 5 photographs is presented. A method of classification of rilles is described which will provide a means of quantitatively grouping rilles of similar planemetric shape. The method is based on a finite Fourier approximation of the edge of the rille. It provides an adequate approximation to all planemetric characteristics of the rille except rille recurvature.
Document ID
19720006183
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Oberbeck, V. R. (NASA Ames Research Center Moffett Field, CA, United States)
Greeley, R. (Santa Clara Univ. Moffett Field, CA, United States)
Morgan, R. B. (NASA Ames Research Center Moffett Field, CA, United States)
Lovas, M. J. (NASA Ames Research Center)
Date Acquired
September 2, 2013
Publication Date
November 1, 1971
Subject Category
Space Sciences
Report/Patent Number
NASA-TM-X-62088
Report Number: NASA-TM-X-62088
Accession Number
72N13832
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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