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An eclectic integrated circuit reliability modelA general form of a comprehensive reliability modeling rationale was formulated for the integrated circuit. Integrated device failure models amenable to long term applications were investigated.
Document ID
19720006613
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Fetcher, B. C. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 2, 2013
Publication Date
January 1, 1972
Subject Category
Electronics
Report/Patent Number
NASA-CR-125062
JPL-TM-33-514
Report Number: NASA-CR-125062
Report Number: JPL-TM-33-514
Accession Number
72N14262
Funding Number(s)
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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