NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Due to the lapse in federal government funding, NASA is not updating this website. We sincerely regret this inconvenience.

Back to Results
Fabrication and testing of scatter plates for interferometryScatter plate interferometry has become a reliable method of measuring surface configurations of telescope mirrors and other optical components. The scatter plate used in an instrument should be of optimum quality if the surface it is being used to measure is to be of high accuracy. Tests were performed and results show that, although many scatter plates would function, few were of the optimum quality necessary. These few were of the 180 grit group, using 35- and 30-s exposures, which are figures derived from calculations.
Document ID
19720024823
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Pour, J. J., Sr.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Pitts, J. R.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 2, 2013
Publication Date
June 30, 1972
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-X-64691
Report Number: NASA-TM-X-64691
Accession Number
72N32473
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available