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Electron microscopy and diffraction of layered, superconducting intercalation complexes.Several layered, transition metal dichalcogenide intercalation complexes with unique superconducting properties have been examined by high-resolution electron microscopy and electron diffraction. Details of the crystalline lattice and of the lattice imperfections have been directly resolved. The results can be correlated with the available X-ray diffraction and chemical data, and they confirm and extend the postulated models.
Document ID
19720026353
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Fernandez-Moran, H.
Ohstuki, M.
Hibino, A.
Hough, C.
(Chicago, University Chicago, Ill., United States)
Date Acquired
August 6, 2013
Publication Date
October 29, 1971
Publication Information
Publication: Science
Volume: 174
Subject Category
Physics, Solid-State
Accession Number
72A10019
Funding Number(s)
CONTRACT_GRANT: NIH-GM-13243
CONTRACT_GRANT: NGR-14-001-012
Distribution Limits
Public
Copyright
Other

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